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Electronic Journal of Plant Breeding
Year : 2024, Volume : 15, Issue : 1
First page : ( 102) Last page : ( 109)
Online ISSN : 0975-928X.
Article DOI : 10.37992/2024.1501.013

Multivariate analysis of grain yield attributes and spot blotch incidence in wheat (Triticum aestivum L.) under sub-Himalayan agroclimatic condition

Kishore Ponaganti Shiva1, Roy Suvendu Kumar1,*, Das Saikat2, Vishnupriya S.1, Ali Basid1, Hijam Lakshmi1, Chakraborty Moumita1, Dutta Puspendu3, Mandal Rupsanatan4, Rout Sanghamitra5

1Department of Genetics and Plant Breeding, Uttar Banga Krishi Vishwavidyalaya, Pundibari, Coochbehar, West Bengal

2AICW&BIP, Uttar Banga Krishi Vishwavidyalaya, Pundibari, Coochbehar, West Bengal

3Department of Seed Science and Technology, Uttar Banga Krishi Vishwavidyalaya, Pundibari, Coochbehar, West Bengal

4Regional Research Station (Terai Zone), Uttar Banga Krishi Vishwavidyalaya, Pundibari, Coochbehar, West Bengal

5Department of Genetics and Plant Breeding, CUTM, Paralakhemundi, Odisha

*E-Mail: suvendukumarroy@gmail.com

Online Published on 18 April, 2024.

Abstract

An Elite Spring Wheat Yield Trial (EWYT) was conducted with 50 diverse genotypes of Wheat (Triticum aestivum L.) and analyzed by multivariate analysis during 2018-19 rabi season. Correlation analysis revealed positive association of plant height, grains per spike, spike length, test weight and biomass with grain yield. Path analysis revealed the highest direct effect on grain yield/metre by biomass/metre (1.508) which was also positively associated with grain yield/metre (0.833). PCA analysis showed 11 principal components out of which five principal components (PC1 to PC5) exhibited eigen value greater than one. The correlation between AUDPC and physiological characters indicated that chlorophyll loss was associated with high spot blotch disease incidence at later stages of crop growth.

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Keywords

Wheat, Correlation, Path analysis, PCA, Spot blotch.

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